The device allows to determine mechanical properties of materials in nano and micro scale (adjustable force range from 1 mN to 20 N) such as: hardness, Young's modulus, plastic and elastic work, wear, adhesion and cohesion of coatings. Equipped with atomic force microscopy module (AFM) it is possible to map surface topography and determine roughness parameters, such as Sa, Sq and Sy. It is possible to perform measurements for ceramic, polymer, metal and composite materials.
Details
Manager / operator
Manager
Operator
Manufacturer
Laboratory where the equipment is located
Location
Access rules
Rules for the use of the equipment will be consistent with the research infrastructure management system being developed. Elements of this system will include how to request research, who will be responsible for conducting the research, and rules of procedure for intellectual property rights to the results. The system will also include a settlement for research allowing for free-of-charge research in the case of collaborative publication or reciprocal use of the equipment.