Solid state characterization laboratory

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The laboratory is equipped with a high-class JEOL-7610F scanning electron microscope, FTIR spectrophotometer - Nicolet iS5, Raman spectrophotometer - DXR 532 nm Filter and DR-UV-Vis - Evolution 220 spectrophotometers. The laboratory offers the possibility of imaging and characterizing materials and nanomaterials. It enables the study of morphology, optical properties, determination of the band gap of semiconductor materials, the study of the structure and surface properties of semiconductor and metallic materials and composites.

Examples of research articles:

Publications

10.3390/catal10040403 ; 10.1039/d0en00580k ;