Description
The LEXT OLS4000 3D Laser Measuring Microscope is designed for nanometer-level imaging, 3D measurement, and roughness measurement. The microscope has a line roughness-specific mode enabling roughness profile measurement for sample lengths up to 100 mm with the automatic line stitching function. Magnification ranges from 108x - 17,280x. Light Source/Detector : 405 nm Semiconductor Laser/ Photomultiplier. Differential Interference Contrast unit: Slider: U-DICR, and Polarizing Plate Unit Built-in
Details
Type of infrastructure:
'Core Lab' laboratory
Strategic infrastructure:
No
Accessibility
scientific research
commercial activities
Manager / operator
Manager
Manager's name
dr inż. Marta Prześniak-Welenc
Manager's e-mail
marwelen@pg.edu.pl
Operator
Operator's name
dr inż. Marcin Łapiński
Operator's e-mail
marcin.lapinski@pg.edu.pl
Manufacturer
Manufacturer
Olympus
Year of production
2012
Laboratory where the equipment is located
Name of the laboratory
Laboratory of Electron Microscopy
Laboratory Website
Location
University
Gdańsk University of Technology
Location Website
Access rules
Access rules
Equipment used by qualified personel of the Insitute; collaboration on project in papers preparation, projects on grants and commertial - basing on individual discussions