Jasco FT/IR-410 Spectrometer

Jasco FT/IR-410 is a powerful Mid-IR FTIR spectrometer (wavenumber range 7800 to 350 cm-1), with many features that you find in a research grade instrument, such as non-hygroscopic KRS-5 windows to prevent damage to the interferometer, a temperature controlled DLaTGS detector and a high output ceramic source for maximum sensitivity. Permanent optical alignment is guaranteed by corner cube (retro-reflective) mirrors with auto-alignment for maximum energy. With high resolution 0.4cm-1 and a S/N greater than 35,000:1.
For most routine analysis the FT/IR-4X is used with the integrated ATR-PRO 4X single bounce ATR with a choice of prisms including a high throughput monolithic diamond, germanium (ideal for carbon-black samples) or ZnSe (with high index of refraction = 2.4). A choice of clamps with pressure up to 10,000 psi ensures the best sample contact with the crystal.
For flexible applications a second detector can be added, such as an MCT or InGaAs with automatic exchange and dedicated options to work from the near- to mid-IR and from mid- to the far-IR. Combined with Spectra Manager™ Suite, that is compatible with Windows 10 or 11 Pro and Enterprise with user-customizable interface for automating routine tasks such as sample identification and quality testing using Quick-Start and QC Compare (with build your own library capability).
System Features
• Wavenumber range, with standard DLaTGS detector 7800 to 350 cm-1
• Optional NIR and Far IR options with ceramic light source or halogen lamp, fixed broad-band beam-splitter and two detector positions
• Comprehensive range of sampling accessories with IQX Accessory recognition for solids, liquids and gases
• Built-in automated validation with NIST traceable polystyrene and glass filters
• Vibration-proof optical bench
• Large sample compartment
• Corner-cube (retro-reflective) mirrors with automatic energy alignment
• Purgeable sections: sample compartment and detector housing (interferometer as option)
• High sensitivity DLaTGS detector
• Options for FTIR microscopy and IR Imaging
• Up to 80Hz Rapid scan with interval scan for fast kinetic measurement
• Wavenumber extension for NIR, mid-IR and far-IR
• Optional 21 CFR part 11, IQ OQ and GxP compliance