X-RAY DIFFRACTOMETER SmartLab SE

X-ray diffraction (XRD) is a key technique for the structural characterization of crystalline materials. The Rigaku SmartLab SE is a versatile X-ray diffractometer designed for routine and advanced materials analysis. It enables qualitative and quantitative phase identification using powder XRD, allowing reliable determination of crystalline phases in metals, ceramics, semiconductors, polymers, and composite materials.
The system supports crystallographic analysis, including determination of lattice parameters, crystal structure, and preferred orientation. High angular resolution and precise goniometer control allow accurate peak position measurements, essential for structural refinement and residual stress analysis. The SmartLab SE is also suitable for microstructural investigations, such as estimation of crystallite size and microstrain based on diffraction peak broadening. Additionally, when equipped with a capillary sample holder, the instrument enables XRD analysis of liquids and suspensions, allowing investigation of dispersed crystalline phases and short-range order in non-solid samples.
Thanks to its modular design and automated alignment, the Rigaku SmartLab SE ensures high reproducibility and ease of use, making it suitable for both research and industrial quality control applications.