X-ray diffraction (XRD) is a key technique for the structural characterization of crystalline materials. The Rigaku SmartLab SE is a versatile X-ray diffractometer designed for routine and advanced materials analysis. It enables qualitative and quantitative phase identification using powder XRD, allowing reliable determination of crystalline phases in metals, ceramics, semiconductors, polymers, and composite materials.
An X-ray diffractometer Gemini R Ultra Ruby CCD (Oxford Diffraction) allows the analysis of the structure of crystalline substances from their diffraction images of recorded reflection angles and the intensity of deflected radiation beams. Diffractometer Gemini R Ultra is equipped with two radiation sources: Cu (?= 1.54433 ?) and Mo (?=0.71354 ?) and a Ruby CCD detector. This allows the measurement of small-molecule (up to 800 Da) monocrystalline compounds within the temperature range 100-300 K.